Midterm review of UnivSEM project

The midterm review of UnivSEM (Universal Scanning Electron Microscope as a Multi-nano-analytical Tool) project that evaluated the first 18 months of the project took place in Thun, Switzerland from 12 to 13 November 2013. EC Project Officer together with the assigned Project Technical Advisor was present. The first integration of SEM chambers and vacuum-operated CRM (Confocal Raman Microscopy) shows unprecedented results of the same sample spot image, with optical resolution of 360 nm, which is well beyond the foreseen result (500 nm). This part of the tool is now ready to perform several characterization tests, which will lead to optimization of the settings. Consequently, hardware and software integration of all techniques should provide the universal nano-analytical tool for multipurpose use. The expected socio-economic impact of the resulting tool is very high due to having one single tool allowing researchers and quality control employees capabilities, which were recently possible only by several devices. This will be particularly appreciated for forensic, geological and biological applications, but also in developing markets like organic or hybrid (opto-) electronics (e.g. OLEDs, OPVs). You can find more about UnivSEM project and the meeting on www.univsem.eu.